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Figure 2

From: Manipulating nanostructure to simultaneously improve the electrical conductivity and strength in microalloyed Al-Zr conductors

Figure 2

Experimental measurements on the dislocation density and dislocation density-grain size correlation. (a) Dislocation density of the Al-Zr conductors under different processing routes (I-type with no aging, II-type with post-aging after cold drawing, and III-type with pre-aging before cold drawing) and different aging temperature (265 and 400 °C). The aging temperature of 0 corresponds to I-type with no aging. (b) Correlation between the dislocation density (\(\rho \)) and the average grain size (d). The dash line follows the expression of d ∝ (ρ)−1.

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