Figure 1

Surface FE-SEM morphologies of the test Ti and Ti2448 specimens. (a) Ti-M: Ti specimen mechanically polished with SiC paper up to #1200; (b) Ti2448-M: Ti2448 specimen mechanically polished with SiC paper up to #1200; (c) Ti2448-A1: Ti2448-M treated through electrochemical anodization with current A1; (d) Ti2448-A2: Ti2448-M treated with current A2. Surface AFM topography and roughness of the test Ti and Ti2448 specimens: (e) Ti-M; (f) Ti2448-M; (g) Ti2448-A1; (h) Ti2448-A2. Cross-sectional TEM images of the anodized Ti2448 specimens: (i) Ti2448-A1; (j) Ti2448-A2; (k) Higher magnification of (j) with the diffraction patterns of the selected area.