Figure 3
Full-field mapping of the oxide film thickness at different temperatures and times using the SiO2 micro-pillar as a reference marker. Each sub-figure corresponds to that in Fig. 2.
Figure 3 | Scientific Reports
Full-field mapping of the oxide film thickness at different temperatures and times using the SiO2 micro-pillar as a reference marker. Each sub-figure corresponds to that in Fig. 2.
