Figure 3
From: Engineering of III-Nitride Semiconductors on Low Temperature Co-fired Ceramics

AFM intensity maps for surfaces of samples CT3. (a) ST1 (b) CT4 (c) and SC1 (d). The color-scales for the depth are given in nanometers.
From: Engineering of III-Nitride Semiconductors on Low Temperature Co-fired Ceramics
AFM intensity maps for surfaces of samples CT3. (a) ST1 (b) CT4 (c) and SC1 (d). The color-scales for the depth are given in nanometers.