Figure 5 | Scientific Reports

Figure 5

From: Thermally Introduced Bismuth Clustering in Ga(P,Bi) Layers under Group V Stabilised Conditions Investigated by Atomic Resolution In Situ (S)TEM

Figure 5

Atomic resolution HAADF STEM image of the Ga(P92.6Bi7.4) layer. The brighter region in the middle of the image shows a Bi cluster embedded in the Ga(P92.6Bi7.4) layer. The inset shows the inverted FFT of the STEM image shown in (a). Plot (b) shows the EDS result of the BiMα edge derived from the region at the Bi cluster (black line) and from a region without any local Bi enrichment (red line).

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