Figure 1
Scanning electron microscope images of vertical nanostructured SnOx pillars on ~150 nm thick ITO Sn-reduced substrate. (a) 45° tilt angle, and (b) 0° tilt angle. The two figures share the same scale bar. The images are taken before starting the sensing tests and is representative of the post-sensing morphology, as no change can be noticed under the SEM. (c) Response of vertical nanostructured SnOx pillars after exposure for 100 s to several gases at low temperatures (30 or 90 °C) in low vacuum (10−5 mbar).
