Figure 1

Structural characterizations of DPB. (a) Powder XRD pattern of bulk DPB polycrystalline sample. (b) Gonio-mode XRD pattern of DPB thin film with [110] oriented planes. Inset shows rocking curve of (220)-Bragg reflection with FWHM value ~0.088°. (c) AFM topographic image of DPB thin film with thickness ~20 nm. (d) Tilted 3D AFM image of same sample showing roughness ~0.8 nm.