Figure 1
From: Highly-Sensitive Refractive Index Sensing by Near-infrared Metatronic Nanocircuits
Design and characterization of the fabricated nanocircuits. (a) Schematic view (b) SEM image (c) 3D view generated by AFM measurement of the fabricated ITO metatronic nanocircuits. (d) Transmission spectra of patterned NRs in both parallel and perpendicular regimes of the incident E-field wave vector.
