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Figure 2

From: Atomic number dependence of Z contrast in scanning transmission electron microscopy

Figure 2

Atomic number dependence of atomic scattering factors in log-log plot and experimental settings for ADF imaging in pioneering studies. (a) Amplitudes of atomic scattering factors for different scattering parameters s (=sinθ/λ). Broken lines are power-law fittings Zn(s) for each value of scattering parameter. (b) Scattering angle as a function of acceleration voltage and scattering parameter. Marks show ADF inner angles of the present study and the published papers as follows: SP11, MN5, PJ2, KC13, SSHS24 and SSHSS25.

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