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Figure 1

From: Systematic Study of Ferromagnetism in CrxSb2−xTe3 Topological Insulator Thin Films using Electrical and Optical Techniques

Figure 1

(a) X-ray diffraction spectra (2θ) of the Cr-doped Sb2Te3 films on c-plane sapphire substrates [Al2O3 (0001)] as a function of Cr concentration x. The (0 0 l) film peaks (l = 3, 6, …) are labelled. The dashed vertical line indicates the position of the peak for the lowest doping concentration, and a shift of the peak position to larger angles (smaller c-axis lattice constants) is found with increasing doping concentration. (b) XPS spectra obtained from the 3d Sb shell. Upon increasing the Cr concentration x, the peaks shift towards lower energy indicating the doping of Cr into Sb sites.

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