Table 1 Substrate mean strain, uncertainty on DIC strain and values of mean and standard deviation for the histograms presented in Figs 3 and 4.

From: Aggregate-driven reconfigurations of carbon nanotubes in thin networks under strain: in-situ characterization

Number of layers

Low-resolution images

High-resolution images

2

20

6

20

Substrate mean strain [%]

0.51

N/A

0.56

N/A

Uncertainty on DIC strain [%]

0.22

0.18

0.46

0.59

Histogram mean strain [%]

0.58

0.62

0.95

0.64

Histogram absolute standard deviation on strain [%]

0.44

0.21

1.0

0.33

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