Figure 4

(a) The ratio I(SiG)/I(Si0) as a function of the flake thickness. The blue (°) markers shows experimental data from the tape exfoliated HOPG flakes in the Horiba XploRA PLUS Raman system as a function of the measured thickness in nm together with a fitted trend line. (b) Flake thickness distribution for S1 and S2 after 10 passes together with one upper and one lower trend line.