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Figure 1

From: Structural and Photoelectric Properties of Epitaxially Grown Vanadium Dioxide Thin Films on c-Plane Sapphire and Titanium Dioxide

Figure 1

The experimental XRD, AFM, and simulated RHEED patterns of VO2 on c-Al2O3 and TiO2. (a) The XRD 2θ scan for VO2 on c-Al2O3(0001) and TiO2(001) where the intensity scale in arbitrary units is log scaled. (b) The simulated RHEED pattern of the 0° rotation for the monoclinic phase of VO2 where the streak intensity patterns are recorded on top and the simulated diagrams are reported on bottom with the in plane lattice planes are recorded for each. (c) The simulated RHEED patterns of the 0° rotation for the rutile phase of VO2 where the placement of the plots is the same as the previous monoclinic phase. (d) The AFM image of the surface microstructure of VO2 on c-Al2O3(0001) where the scale is 5.0 μm × 5.0 μm. (e) The AFM image of the of the surface microstructure of VO2 on TiO2(001) where the scale is 5.0 μm × 5.0 μm. (f) The orientations of the vanadium and oxygen atoms through the 0° and 90° rotations of one unit cell where the first two surface layers of atoms are shown in the c-direction where the red layer is displaced ~1.44 nm below the blue layer.

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