Figure 3 | Scientific Reports

Figure 3

From: A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in Ohmic-Contact Nanowire Devices

Figure 3

Pumping-density-dependent SPCM measurement in an InAs nanowire. (a) I–V characteristics. Inset: SEM image for the measured nanowire device. (b) Scanning photocurrent measurement with an applied electric field of 53.1 V/cm under different pumping densities. (c) Fitted decay length as a function of pumping density. The nanowire length between electrodes is 5.8 μm shown with yellow background and the excitation spot size is around 800 nm. The photocurrent profiles are offset vertically for clarity.

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