Figure 4 | Scientific Reports

Figure 4

From: A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in Ohmic-Contact Nanowire Devices

Figure 4

Electric-field-dependent SPCM measurement. (a) Scanning photocurrent profiles with varied applied electric field under pumping density of 46 W/cm2. (b) The fitted and corrected hole decay lengths as a function of the applied electric field. The dashed lines show the fitting curve using Eq. (3). The nanowire length between electrodes is 3 μm shown with yellow background and the excitation spot size is around 800 nm. The photocurrent profiles are offset vertically for clarity.

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