Figure 6

Cr L_2,3 spectra of a clean, ~100-nm-thick film of Cr₂Te₃. Measurement carried out in a 6T field at 3K with 30° grazing incidence angle of the x-rays. (a), The XAS (average of μ⁺ and μ⁻) obtained from multiplet calculations and as measured in LY. (b), The XMCD (μ⁺ − μ⁻) as calculated and as measured in LY. The red lines at 572.7 eV mark the location of the small Te M₅ peak expected in the LY data, which is not clearly evident here. Spectra are normalized to the size of the maximum XMCD signal.