Figure 2

EDXD patterns. Low angle region comparison of pristine (black line) and annealed (red line) Zn/Al \(({{\rm{NO}}}_{3}^{-})\)-LDH films (growth times 2 h, 15 h, 24 h). In-situ measurement allows for an accurate determination of the basal plane shrinking, as evidenced by the arrows, associated to dehydration caused by thermal annealing.