Figure 1

(a,b) SEM images for the etched samples A (a) and B (b); the scale bar length is 5 μm. (c,d) X-ray diffraction patterns of the as-grown, etched InN films of samples A (c) and B (d).
(a,b) SEM images for the etched samples A (a) and B (b); the scale bar length is 5 μm. (c,d) X-ray diffraction patterns of the as-grown, etched InN films of samples A (c) and B (d).