Figure 7
Schematic cross section of nanoparticle-based memristive devices for testing with C-AFM (a) or in a conventional two-probe setup (b). The nanoparticles (blue) are embedded in a dielectric matrix (SiO2, green), which is deposited on a metal contact layer (Au or Au/Cr, orange). The AFM tip (magenta) locally contacts individual nanoparticle switches, while macroscopic contacts such as a PtRh wire exhibit a significantly larger contact area.
