Figure 4

Diffraction peak patterns as a function of true strain collected at (a) AM SS 316 L and (b) AM CrCoNi specimens. Obtained by the axial detector where the scattering vector (Q) is paralleled to the longitudinal direction (LD). The evolution of lattice strains along the LD and normal direction (ND) measured from grain families of {111}, {200}, {220}, {311}, and {222} crystallographic planes during loading in (c) AM SS 316 L and (d) AM CrCoNi specimen.