Table 4 Overall comparison of the parameters extracted from different methods.
Characterization Method | Device | (n) | Rs (kΩ) | ΦB (eV) |
---|---|---|---|---|
Conventional I–V | Ag/F8/P3HT/ITO | 4.03 | 269 | 1.03 |
Ag/F8-CdSe/P3HT/ITO | 2.38 | 78.2 | 1.17 | |
Cheung Function | Ag/F8/P3HT/ITO | 4.26 | 310 | 1.11 |
Ag/F8-CdSe/P3HT/ITO | 2.42 | 89 | 1.20 | |
Norde’s Function | Ag/F8/P3HT/ITO | — | 301 | 1.10 |
Ag/F8-CdSe/P3HT/ITO | — | 90 | 1.22 |