Figure 1
From: Interfacial effects on leakage currents in Cu/α-cristobalite/Cu junctions
(a) Geometric structure of the junction consisted of an α-cristobalite (001) slab in between Cu (001) electrodes, with (b) oxygen-rich, (c) oxygen-poor, or (d) silicon-rich interfaces. (e) Current-voltage characteristics of the junctions.
