Table 3 λ, \({\langle {\Omega }^{2}\rangle }^{1/2}\), ∫g(E)EdE, ωln, \({T}_{C,cal}^{ADMM}\) calculated for all samples, using μ* = 0.117 and \({T}_{C,cal}^{E}\) calculated for all samples, using μ* = 0.119. The last column shows the experimentally obtained critical temperature, TC,exp *(the error on TC,exp is 0.05 K for all samples and is determined by the temperature stability of the SQUID magnetometer, the errors indicated for the other quantities are based on the statistical error of the PDOS).
From: The influence of phonon softening on the superconducting critical temperature of Sn nanostructures
Sample | λ | \({{\boldsymbol{\langle }}{{\boldsymbol{\Omega }}}^{{\bf{2}}}{\boldsymbol{\rangle }}}^{{\bf{1}}{\boldsymbol{/}}{\bf{2}}}\) | ∫g(E)EdE | ωln | \({{\boldsymbol{T}}}_{{\boldsymbol{C}}{\boldsymbol{,}}{\boldsymbol{c}}{\boldsymbol{a}}{\boldsymbol{l}}}^{{\boldsymbol{A}}{\boldsymbol{D}}{\boldsymbol{M}}{\boldsymbol{M}}}\) | \({{\boldsymbol{T}}}_{{\boldsymbol{C}}{\boldsymbol{,}}{\boldsymbol{c}}{\boldsymbol{a}}{\boldsymbol{l}}}^{{\boldsymbol{E}}}\) | TC,exp* |
|---|---|---|---|---|---|---|---|
(meV) | (meV) | (meV) | (K) | (K) | (K) | ||
119Sn foil | 0.76 ± 0.04 | 10.4 ± 0.2 | 11.62 ± 0.03 | 8.1 ± 0.2 | 3.7 ± 0.2 | 3.7 ± 0.2 | 3.85 |
isl60 | 0.82 ± 0.03 | 9.9 ± 0.3 | 10.82 ± 0.04 | 7.8 ± 0.2 | 4.1 ± 0.2 | 4.2 ± 0.2 | 4.17 |
isl40 | 0.84 ± 0.06 | 9.8 ± 0.4 | 10.74 ± 0.05 | 7.6 ± 0.3 | 4.3 ± 0.4 | 4.4 ± 0.3 | 4.38 |
clus46 | 0.82 ± 0.04 | 9.8 ± 0.3 | 10.36 ± 0.03 | 7.6 ± 0.2 | 4.1 ± 0.2 | 4.1 ± 0.2 | 3.93 |
