Figure 3
From: Discovery of Ternary Silicon Titanium Nitride with Spinel-Type Structure

X-ray powder diffraction of SiTiN-run HH112 (λ = 0.207109 Å) and Rietveld refinement.
From: Discovery of Ternary Silicon Titanium Nitride with Spinel-Type Structure
X-ray powder diffraction of SiTiN-run HH112 (λ = 0.207109 Å) and Rietveld refinement.