Table 2 Convergence factors of the Rietveld Method (RWP, REXP), Goodness of Fit (SGoF) and global χ2 of the fitting.

From: Structural characterization of SnO nanoparticles synthesized by the hydrothermal and microwave routes

Samples

RWP (%)

REXP (%)

SGOF

χ2

H0h45

6.87

4.69

2.1

3.19

H1h00

6.78

5.07

1.8

3.21

H2h00

16.12

4.38

3.6

6.00

H4h00

7.98

5.21

2.1

4.53

H6h00

7.74

5.02

2.1

4.44

M0h45

8.47

4.94

3.0

5.20

M1h00

8.50

5.04

3.2

5.62

M1h30

7.71

5.10

2.1

4.61

M2h30

7.68

5.08

2.3

5.14