Figure 8

Atomic force microscopy (AFM) images of PLA/rubrene crystal film obtained by spin-coating the 10Â mg/mL rubrene solutions on a 57.2Â nm PLA modified FTO wafer after the solvent vapor annealing procedure.
Atomic force microscopy (AFM) images of PLA/rubrene crystal film obtained by spin-coating the 10Â mg/mL rubrene solutions on a 57.2Â nm PLA modified FTO wafer after the solvent vapor annealing procedure.