Figure 2 | Scientific Reports

Figure 2

From: Neutron diffraction analysis of stress and strain partitioning in a two-phase microstructure with parallel-aligned phases

Figure 2

(a) The setup of ENGIN-X diffractometer at ISIS. Demonstration of full-profile Rietveld refinement via GSAS for two diffraction patterns from axial direction (b) and two diffraction patterns from transverse direction (c). The results in (b,c) show measured data points, calculated curves and the difference between measured and calculated curves.

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