Table 2 XPS data for collected and solution treated dust.
From: Adhesion characteristics of solution treated environmental dust
| Â | O1s | C1s | Si2p | Ca2p | N1s | Al2p | F1s |
|---|---|---|---|---|---|---|---|
Prior etching | |||||||
Collected | 52.11 | 23.19 | 10.82 | 5.17 | 0.27 | 5.71 | 1.10 |
Solution treated | 30.19 | 21.93 | 3.82 | 10.04 | 1.41 | 2.61 | 29.99 |
After 20Â s etching | |||||||
Collected | 58.26 | 9.15 | 12.75 | 7.14 | 1.03 | 7.42 | 0.00 |
Solution treated | 26.86 | 8.72 | 7.60 | 11.99 | 0.00 | 3.42 | 41.32 |
