Table 2 Lattice parameters d and grain sizes L of the B2 and A1 phases in the as-deposited MgO(100)/ [nFeRh/57FeRh]10 sample and after the indicated treatment from high-angle X-ray diffraction (XRD).

From: Reversible control of magnetism in FeRh thin films

Phase

Parameter

As-deposited

Annealed

Irradiated

Re-annealed

B2

d [Å]

N/A

3.008(1)

N/A

3.021(1)

L [Å]

N/A

348(11)

N/A

230(10)

A1

d [Å]

3.761(1)

N/A

N/A

N/A

L [Å]

78(4)

N/A

N/A

N/A

  1. The numbers in bracket mean the standard deviation in the last digits. In case of the Annealed and Re-annealed states, the value of L was determined from the 2 ϴ ≈ 29.7° reflection, however, the analysis based on the 2 ϴ ≈ 61.7° reflection gives very similar results.
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