Figure 1
(a) 500 × 500 nm2 AFM images, (b) The XRD curves of three samples with 10 nm Au deposited on 300 nm SiO2/Si, c-plane sapphire and tri-layer MoS2/c-plane sapphire substrates at RT. (c) The cross-sectional HRTEM image of the sample grown on the MoS2 surface.
