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Figure 1

From: Bulk-like dielectric and magnetic properties of sub 100 nm thick single crystal Cr2O3 films on an epitaxial oxide electrode

Figure 1

Synthesis of single crystalline Cr2O3 thin films on V2O3 electrodes. (a) \(2\theta -\omega \) X-ray diffraction scans illustrating phase purity and the (0001) orientation of 70 nm thick Cr2O3 films on (111)-oriented Pt (40 nm)/Ti (4 nm)/YSZ (red) and 30 nm thick Cr2O3 films on (0001)-oriented V2O3 (30 nm)/Al2O3 (blue). (b) \(\phi \)-scans of the {014} peaks of Cr2O3 reveal the in-plane twinning of the films on Pt/Ti buffered YSZ and single crystallinity on the V2O3 buffered Al2O3. (c,d) AFM topographs of Cr2O3/Pt/Ti/YSZ and Cr2O3/V2O3/Al2O3. Scale bar: 500 nm. The y-scale for X-ray diffraction data is logarithmic.

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