Figure 5
From: Ion irradiation induced phase transformation in gold nanocrystalline films
Gold thin-film specimen characterization. (a) Representative low-loss EEL spectrum used to determine crystal thickness; inset shows a representative HAADF-STEM image of the gold film, the dashed red box denotes the region for low-loss EEL spectrum acquisition. (b) Precession electron diffraction map from the NC gold film before ion irradiation with inset inverse pole figure key.
