Figure 4 | Scientific Reports

Figure 4

From: Controllable deposition of organic metal halide perovskite films with wafer-scale uniformity by single source flash evaporation

Figure 4

Uniformity test of flash evaporated MAPbI3 films. (a) Cross-sectional SEM images for the thickness comparison of the MAPbI3 film by the substrate location given in Fig. 1c. (b) The measured thickness values presented in box and whisker diagram at each location. (c) A histogram of all the thickness data. (d) Comparison circles from the Tukey test. (e) Color map image of the average thickness values at each substrate location on the 4-inch wafer. (f) The estimated thickness of the perovskite film by Gaussian process. (g) UV–visible absorbance spectra of the MAPbI3 films at the different substrate locations.

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