Figure 4 | Scientific Reports

Figure 4

From: In-situ spatial and temporal electrical characterization of ZnO thin films deposited by atmospheric pressure chemical vapour deposition on flexible polymer substrates

Figure 4

Images of (a) a bare silicon wafer (AFM), (b) silicon wafer with 5 oscillations of ZnO deposition at 150 °C (AFM), (c) silicon wafer with 30 oscillations of ZnO deposition at 150 °C (AFM) and (d) polyimide with 30 oscillations of ZnO deposition at 150 °C (SEM). Island formation and coalescence is observed, as well as delayed island growth on polymer substrate.

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