Table 1 Typical results of NIST tests for bitstreams generated from the microplasma current time series for the two cases of visible and non-visible electrical current arc.

Statistical test	Visible electrical current arc									Non-visible electrical current arc
	10 Mbit/s			50 Mbit/s			100 Mbit/s			100 Mbit/s
	P-value	Proportion	Assessment	P-value	Proportion	Assessment	P-value	Proportion	Assessment	P-value	Proportion	Assessment
F	0.739918	50/50	Success	0.137282	50/50	Success	0.739918	49/50	Success	0.574903	98/100	Success
BF	0.779188	50/50	Success	0.911413	49/50	Success	0.122325	50/50	Success	0.816537	99/100	Success
CS	0.419021	50/50	Success	0.213309	50/50	Success	0.534146	49/50	Success	0.401199	98/100	Success
R	0.262249	49/50	Success	0.779188	50/50	Success	0.023545	49/50	Success	0.055361	99/100	Success
LR	0.383827	50/50	Success	0.236810	47/50	Success	0.935716	50/50	Success	0.999438	99/100	Success
Rk	0.383827	50/50	Success	0.455937	50/50	Success	0.816537	50/50	Success	0.834308	100/100	Success
FFT	0.419021	50/50	Success	0.122325	48/50	Success	0.657933	49/50	Success	0.236810	100/100	Success
NOT	0.383827	47/50	Success	0.419021	50/50	Success	0.616305	48/50	Success	0.897763	99/100	Success
OT	0.935716	49/50	Success	0.739918	49/50	Success	0.191687	50/50	Success	0.616305	100/100	Success
U	0.739918	50/50	Success	0.574903	50/50	Success	0.419021	50/50	Success	0.213309	10/10	Success
AE	0.883171	49/50	Success	0.066882	49/50	Success	0.289667	50/50	Success	0.224821	100/100	Success
RE	0.002971	15/15	Success	0.834308	26/26	Success	0.911413	22/22	Success	0.012650	15/15	Success
REV	0.437274	15/15	Success	0.012650	26/26	Success	0.122325	22/22	Success	0.275709	15/15	success
S	0.262249	49/50	Success	0.657933	49/50	Success	0.779188	48/20	Success	0.935716	99/100	Success
LC	0.236810	49/50	Success	0.383827	47/50	Success	0.699313	50/50	Success	0.616305	100/100	Success

When arcing is visible (inter-electrode distance of \(\sim\) 1 mm), we tested bitstream of 24 Mbit in length (50 sequences of 480,000 bits) collected at the sampling rates of 10 MS/s, 50 MS/s and 100 MS/s. For the case of non-visible arcing (inter-electrode distance of \(\sim\) 3–4 mm), we tested bitstream of 16 Mbit in length (100 sequences of 160,000 bits, for Universal test 10 sequences of 1,600,000 bits) collected at the sampling rate of 100 MS/s. (F stands for test Frequency, BF for Block Frequency, CS for Cumulative Sums, R for Runs, LR for Longest Run, Rk for Rank, FFT for Fast Fourier Transform, NOT for Non Overlapping Template, OT for Overlapping Template, U for Universal, AE for Approximate Entropy, RE for Random Excursions, REV for Random Excursions Variant, S for Serial, and LC for Linear Complexity).

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