Table 2 Typical NIST SP 800-22 tests results performed on 100 Mbit-long bitstreams collected from Bits 3 to 6 from the ADC register at the sampling rate of 100 MS/s.

Statistical test	Bit 3			Bit 4			Bit 5			Bit 6
Statistical test	P-value	Proportion	Assessment	P-value	Proportion	Assessment	P-value	Proportion	Assessment	P-value	Proportion	Assessment
F	0.1088	98/100	Success	0.2493	98/100	Success	0	0/100	Fail	0	0/100	Fail
BF	0.9114	98/100	Success	0.5544	98/100	Success	0	0/100	Fail	0	0/100	Fail
CS	0.4823	98/100	Success	0.4466	97/100	Success	0	0/100	Fail	0	0/100	Fail
R	0.4373	99/100	Success	0.8832	99/100	Success	0	0/100	Fail	0	0/100	Fail
LR	0.4190	99/100	Success	0.2622	98/100	Success	0	0/100	Fail	0	0/100	Fail
Rk	0.0856	99/100	Success	0.6787	99/100	Success	0.6371	100/100	Success	0.2368	100/100	Success
FFT	0.8343	100/100	Success	0.4012	99/100	Success	0.2493	99/100	Success	0	0/100	Fail
NOT	0.4718	98/100	Success	0.5151	98/100	Success	0.3116	99/100	Success	0.2696	98/100	Success
OT	0.3505	100/100	Success	0.7598	99/100	Success	0.0010	95/100	Fail	0	0/100	Fail
U	0.4944	97/100	Success	0.1816	99/100	Success	0	0/100	Fail	0	0/100	Fail
AE	0.6371	98/100	Success	0.6163	100/100	Success	0	0/100	Fail	0	0/100	Fail
RE	0.5689	51/52	Success	0.0533	16.8/17	Success	0	0/100	Fail	0	0/100	Fail
REV	0.4292	51/52	Success	0.0609	17/17	Success	0	0/100	Fail	0	0/100	Fail
S	0.5422	99/100	Success	0.8069	100/100	Success	0.0966	97/100	Success	0	0/100	Fail
LC	0.5141	99/100	Success	0.3041	100/100	Success	0.4559	99/100	Success	0.7598	97/100	Success

The inter-electrode distance of the APAMP system is \(\sim\) 3–4 mm (no visible current arc). (F stands for test Frequency, BF for Block Frequency, CS for Cumulative Sums, R for Runs, LR for Longest Run, Rk for Rank, FFT for Fast Fourier Transform, NOT for Non Overlapping Template, OT for Overlapping Template, U for Universal, AE for Approximate Entropy, RE for Random Excursions, REV for Random Excursions Variant, S for Serial, and LC for Linear Complexity).

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