Figure 2
From: Quantitative material analysis using secondary electron energy spectromicroscopy
Quantitative material contrast mapping of Pt/Au foils on a Al base plate at a primary beam voltage of 1 kV (a) Conventional SE detector image/pixel intensity histogram. (b) Combination spectral image/pixel intensity histogram for k = 0.5. (c) EDX mapping at 2.5 kV.
