Figure 2
XRD patterns of graphite and GO deposited on Si with the peak of graphite observed at 2Ɵ = 26.73° and the peak of GO at 2Ɵ = 11.54°.
Figure 2 | Scientific Reports
XRD patterns of graphite and GO deposited on Si with the peak of graphite observed at 2Ɵ = 26.73° and the peak of GO at 2Ɵ = 11.54°.
