Figure 2
From: Thickness-dependent in-plane anisotropy of GaTe phonons
(a) Optical microscope image of the measured GaTe flake, where the crystal orientation and the angle θ between the polarization of the incident light and the y-axis were indicated. (b,c) AFM image and height profile of the GaTe flake. Polarization-resolved Raman spectra of a thick flake under (d) parallel and (e) perpendicular polarization configurations. Raman intensity polar plots of \({A}_{g}^{7}\) (115 cm−1) and \({B}_{g}^{4}\) (164 cm−1) modes under (f,g) parallel and (h,i) perpendicular polarization configurations, where solid lines represent fitted curves.
