Figure 6 | Scientific Reports

Figure 6

From: Comparative transcriptome analysis of two contrasting resistant and susceptible Aegilops tauschii accessions to wheat leaf rust (Puccinia triticina) using RNA-sequencing

Figure 6

Summary of differentially expressed genes (DEGs) in four comparisons. RC (resistant control), RT (resistant treatment), SC (susceptible control), and ST (susceptible treatment). (a) Up and down-regulated DEG statistics in different comparisons of the resistant or susceptible Ae. tauschii accessions (AT349 or AT350) with/out P. triticina infection, (b) Fold-changes of three common DEGs among all comparisons. (c) The Venn diagram exhibits the distribution of DEGs in different comparisons. 6a and 6b were created using ‘ggplot2 version 3.3.5’ R/CRAN package https://ggplot2.tidyverse.org) while, 6c was created using ‘ggVennDiagram version 1.2.0’ R/CRAN package (https://github.com/gaospecial/ggVennDiagram).

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