Figure 2
3D atomic map of the as-deposited Cu2O:Mg film for which the tip shape shown in (d) was used to guide the tomographic reconstruction. (a) 3D atomic map of Cu and Si atoms is presented by orange and light green dots, respectively (left-hand side) and distribution of Mg in a 1 nm thick slice parallel to the APT specimen axis is shown, presenting a cross-sectional view of the film in dark grey dots (right-hand side). (b) 10 nm thick slices taken at different positions from top to bottom (number 1–4) represent a planar view of the film. In 1, 2 and 4 the 2D Mg ion maps are shown and in 3 this is superimposed with the Cu ion 2D density color map. (c) TEM micrograph of Cu2O:Mg thin film cross-section deposited on silicon and (d) SEM micrograph of the Cu2O:Mg specimen before APT analysis.
