Figure 4

Temperature-dependent Hall effect measurements of Cu2O and Cu2O:Mg thin films. (a) Mobility (μ) and (b) Hall carrier density (p) as a function of the reciprocal temperature, where the lines correspond to the charge balance equation fit.
Temperature-dependent Hall effect measurements of Cu2O and Cu2O:Mg thin films. (a) Mobility (μ) and (b) Hall carrier density (p) as a function of the reciprocal temperature, where the lines correspond to the charge balance equation fit.