Table 1 Summary of upper layer thickness, Hall mobility, and charge carrier density (N) estimated by SEM analysis, and Hall effect and C‒V measurements, respectively.
Upper layer thickness (nm) | Hall mobility (cm2 V−1 s−1) | N (cm−3) | |
---|---|---|---|
solCIGS | 267 ± 25 | 7.3 ± 2.5 | 5.24 × 1016 |
K-solCIGS | 420 ± 38 | 19.1 ± 4.9 | 4.11 × 1016 |