Figure 6
From: Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires
SEM–EDX analysis of a cross section of S20. The analysis was focused on the void located in the Cu matrix. The image on the left shows the EDX map of the cross section and every color indicate a different element of the wire. The EDX maps of Sn and Nb are the top right pictures. The Sn map shows the diffusion of the material outside the sub-elements. The EDX line scan 1 and 2 show the gradient of the Sn diffusion from the void into the Cu matrix.
