Table 2 Characteristics of the voids in the sub-elements for samples S19, S25 and S26.
From: Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires
Sample | Sub-element diameter [µm] | Sub-element void fraction [% of Vtotal] | Voids max. volume [µm3] |
|---|---|---|---|
S19 | 55 ± 5 | 4.2 | 66,300 |
S25 | 47 ± 5 | 4.3 | 27,600 |
S26 | 38 ± 4 | 4.0 | 19,900 |
