Figure 1

BF TEM micrographs showing the representative microstructure and structural defects in the TWIP steel deformed to engineering strain of 0.01 (a,b) and 0.02 (c,d). (a) Dislocations gliding and inducing the slip transfer from the starting grain to the twinned grain, taken in a two-beam condition for g = \({111}\). (b) A stacking fault near the annealing twin boundary (indicated by an arrow filled with dots) and several dislocations in the right-side grain impinged the annealing twin boundary, taken in a two-beam condition for g = \({11}\bar{1}\). (c,d) Dislocations pile-ups and stacking faults nucleation observed near an annealing twin boundary. The emitted stacking faults are indicated by the arrows filled with dots. The corresponding SAED patterns in (c,d) show a fine streak (white arrows), attributed to the shape factor of a planar fault.