Figure 9
From: Investigation of random telegraph signal in two junction layouts of proton irradiated CMOS SPADs

RTS probability as a function of sensitive area for the 115 TeV/g sample (top) and for the 376 TeV/g sample (bottom).
From: Investigation of random telegraph signal in two junction layouts of proton irradiated CMOS SPADs
RTS probability as a function of sensitive area for the 115 TeV/g sample (top) and for the 376 TeV/g sample (bottom).