Table 3 RTS occurrence in irradiated SPADs with DDD=376 TeV/g.

From: Investigation of random telegraph signal in two junction layouts of proton irradiated CMOS SPADs

Active area (μm2)

Total SPADs

SPADs with RTS

2-levels

3-levels

Multi levels (\(\ge 4\))

Total RTS fraction

PN layout

\(10\times 10\)

58

46

6

8

32

\(79\pm 5\) %

\(15\times 15\)

38

30

3

3

24

\(79\pm 6\) %

\(20\times 20\)

58

49

8

0

41

\(84\pm 5\) %

Total

154

116

17

11

97

 

PWNISO layout

\(10\times 10\)

130

48

17

3

28

\(37\pm 4\) %

\(15\times 15\)

80

50

8

3

39

\(63\pm 5\) %

\(20\times 20\)

129

105

15

4

86

\(81\pm 3\) %

Total

339

203

40

10

153