Figure 1

AFM images of GNRs (a) before and (b) after CVD growth, and (c) height profiles along L–L′, M–M′ and N–N′ lines, respectively. (d,e) are the enlarged AFM images obtained from the squares in (a,b). (f) is the surface roughness on the grown GNR and SiO2/Si substrate along S–S′, R–R′ and T–T′ lines, respectively. The AFM images are edited using a software AFM5000/AFM5010 Ver. 6.03A (C) Hitachi High-Tech Science Corp. 2013.