Figure 5
From: Investigation of the thermal tolerance of silicon-based lateral spin valves
Microscopic pictures of sample B after annealing at 400 °C. (a, b) Optical microscopic image (a) before and (b) after annealing at 400 °C. (c) A schematic cross-section of sample B. The areas of EDS observations are roughly indicated by purple and red squares. (d) Elemental mapping image near the FM electrode indicated by the purple rectangle in (c), where Al, Au and Fe are shown in red, blue and green, respectively. (e, f) Elemental mapping images of (e) Au and (f) Ta near the NM electrode indicated by the red rectangle in (c).
